Semi-supervised Learning using Adversarial Training with Good and Bad Samples

Published in Under Review, 2020

Recommended citation: W. Li, Z. Wang, Y. Yue, J. Li, W. Speier, M. Zhou, C. Arnold. "Semi-supervised Learning using Adversarial Training with Good and Bad Samples" Machine Vision and Applications(2020). https://arxiv.org/abs/1910.08540